Title :
Transient current extraction from time domain voltage measurement
Author :
Zhou, Yaping ; Herberg, B.
Author_Institution :
Freescale Semicond. Inc., Austin, TX, USA
Abstract :
An easy method to extract the current signature of a core power supply is suggested and to measure the impedance of the PDS and the voltage at the interface of interest. With modern electromagnetic simulation tools such as SPEED2000 the impedance measurement of the PDS can be eliminated, replaced by a simple time domain simulation. It is used to obtain the transient current during HRESET of a microprocessor system.
Keywords :
circuit simulation; distribution networks; electric impedance measurement; microcomputers; power supply circuits; voltage measurement; HRESET; SPEED2000; core power supply; electromagnetic simulation tools; impedance measurement; microprocessor system; power delivery system; time domain simulation; time domain voltage measurement; transient current signature extraction; Circuit noise; Circuit simulation; Current measurement; Impedance measurement; Microprocessors; Packaging; Power supplies; Semiconductor device measurement; Virtual colonoscopy; Voltage measurement;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
Print_ISBN :
0-7803-8667-1
DOI :
10.1109/EPEP.2004.1407572
