DocumentCode
2806682
Title
Stability analysis of latency insertion method (LIM)
Author
Deng, Zhichao ; Schutt-Aine, I.E.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Champaign, IL, USA
fYear
2004
fDate
25-27 Oct. 2004
Firstpage
167
Lastpage
170
Abstract
In this work, the stability of the latency insertion method (LIM) analogous to the traditional FDTD schemes for the time-domain simulation of networks is analyzed in order to determine the optimal difference scheme for various formulations. The Von Neumann method is used and the stability conditions are given by the limitations on the time step according to R, L and C.
Keywords
Fourier series; RLC circuits; circuit simulation; circuit stability; finite difference time-domain analysis; numerical stability; RLC circuits; Von Neumann method; finite difference time domain simulation; latency insertion method; optimal difference scheme; stability analysis; stability conditions; Analytical models; Computational complexity; Computational modeling; Computer simulation; Delay; Finite difference methods; Stability analysis; Stability criteria; Time domain analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
Print_ISBN
0-7803-8667-1
Type
conf
DOI
10.1109/EPEP.2004.1407574
Filename
1407574
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