Title :
Stability analysis of latency insertion method (LIM)
Author :
Deng, Zhichao ; Schutt-Aine, I.E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Champaign, IL, USA
Abstract :
In this work, the stability of the latency insertion method (LIM) analogous to the traditional FDTD schemes for the time-domain simulation of networks is analyzed in order to determine the optimal difference scheme for various formulations. The Von Neumann method is used and the stability conditions are given by the limitations on the time step according to R, L and C.
Keywords :
Fourier series; RLC circuits; circuit simulation; circuit stability; finite difference time-domain analysis; numerical stability; RLC circuits; Von Neumann method; finite difference time domain simulation; latency insertion method; optimal difference scheme; stability analysis; stability conditions; Analytical models; Computational complexity; Computational modeling; Computer simulation; Delay; Finite difference methods; Stability analysis; Stability criteria; Time domain analysis; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
Print_ISBN :
0-7803-8667-1
DOI :
10.1109/EPEP.2004.1407574
