Title :
Single event latchup protection of integrated circuits
Author :
Layton, P.J. ; Czajkowski, D.R. ; Marshall, J.C. ; Anthony, H.F.D. ; Boss, R.W.
Author_Institution :
Space Electron. Inc., San Diego, CA, USA
Abstract :
This paper will report the test results from the development of the single event latchup protection circuitry (referred to as Space Electronics Inc.´s (SEIs) Latchup Protection Technology (LPTTM)) for several integrated circuits which are known to latchup at unacceptably low LET energies for space applications. Two devices were evaluated with LPTTM; the ADS7805 16 bit analog to digital converter and the GF10009 FPGA (Gatefield´s 9000 gate flash programmable gate array)
Keywords :
analogue-digital conversion; field programmable gate arrays; protection; radiation hardening (electronics); space vehicle electronics; 16 bit; ADS7805 analog to digital converter; GF10009 FPGA; Gatefield flash programmable gate array; LET energy; SEI LPT; integrated circuit; single event latchup protection; space electronics; Aerospace electronics; CMOS technology; Circuit testing; Current supplies; Electronic equipment testing; Integrated circuit technology; Protection; Satellites; Space technology; Voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location :
Cannes
Print_ISBN :
0-7803-4071-X
DOI :
10.1109/RADECS.1997.698919
