Single event latchup protection of integrated circuits

Author

Layton, P.J. ; Czajkowski, D.R. ; Marshall, J.C. ; Anthony, H.F.D. ; Boss, R.W.

Author_Institution

Space Electron. Inc., San Diego, CA, USA

fYear

1997

fDate

15-19 Sep 1997

Firstpage

327

Lastpage

331

Abstract

This paper will report the test results from the development of the single event latchup protection circuitry (referred to as Space Electronics Inc.´s (SEIs) Latchup Protection Technology (LPT^TM)) for several integrated circuits which are known to latchup at unacceptably low LET energies for space applications. Two devices were evaluated with LPT^TM; the ADS7805 16 bit analog to digital converter and the GF10009 FPGA (Gatefield´s 9000 gate flash programmable gate array)

Keywords

analogue-digital conversion; field programmable gate arrays; protection; radiation hardening (electronics); space vehicle electronics; 16 bit; ADS7805 analog to digital converter; GF10009 FPGA; Gatefield flash programmable gate array; LET energy; SEI LPT; integrated circuit; single event latchup protection; space electronics; Aerospace electronics; CMOS technology; Circuit testing; Current supplies; Electronic equipment testing; Integrated circuit technology; Protection; Satellites; Space technology; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on

Conference_Location

Cannes

Print_ISBN

0-7803-4071-X

Type

conf

DOI

10.1109/RADECS.1997.698919

Filename

698919