Title :
Sixth International Workshop on Microprocessor Test and Verification - Title
Abstract :
The following topics are dealt with: automatic test pattern generation; network-on-chip, integrated circuit testing; and microprocessor chips
Keywords :
automatic test pattern generation; integrated circuit testing; microprocessor chips; network-on-chip; automatic test pattern generation; integrated circuit testing; microprocessor chips; network-on-chip;
Conference_Titel :
Microprocessor Test and Verification, 2005. MTV '05. Sixth International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-2627-6
DOI :
10.1109/MTV.2005.27
