DocumentCode :
2806971
Title :
Reliability performance of optical cross-connect switches-requirements and practice
Author :
Wosinska, L. ; Thylen, L.
Author_Institution :
School of Applied Eng., R. Inst. of Technol., Kista, Sweden
fYear :
1998
fDate :
22-27 Feb. 1998
Firstpage :
28
Lastpage :
29
Abstract :
Summary form only given. In the switching systems considered we assumed that each OXC has four input and output links and is capable of switching between 16 wavelength channels (i.e., four wavelength channels per link). In our reliability analysis we assume that the components are defect-free from the beginning. There must be a method of detecting a failure in the systems, and a technique for system recovery from faults. Furthermore, we assume that each component has an exponentially distributed lifetime, that component failure durations are short relative to the times between failures, and that times between failures and the duration of the component failures are independently distributed. Our calculations are based on failure rates and a mean repair time of six h. The reliability performance of suggested OXCs without inherent redundancy are far from that required. To solve this problem we recommend introducing some kind of redundancy for critical components or subsystems to obtain a structure that will be meeting telecommunication standards.
Keywords :
failure analysis; photonic switching systems; redundancy; telecommunication network reliability; component failure durations; exponentially distributed lifetime; failure rates; mean repair time; optical cross-connect switches; redundancy; reliability performance; switching systems; system recovery from faults; times between failures; Asynchronous transfer mode; Frame relay; Optical fiber cables; Optical fiber devices; Optical fiber networks; Optical fiber testing; Optical losses; Space technology; Switches; Switching systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Fiber Communication Conference and Exhibit, 1998. OFC '98., Technical Digest
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-55752-521-8
Type :
conf
DOI :
10.1109/OFC.1998.657176
Filename :
657176
Link To Document :
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