• DocumentCode
    2807136
  • Title

    Infrared luminescence of Xe2 excimers produced by electron impact in dense gas

  • Author

    Borghesani, A.F. ; Carugno, G.

  • Author_Institution
    Dept. of Phys., Univ. of Padua, Padua
  • fYear
    2008
  • fDate
    June 30 2008-July 3 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We observed the infrared emission spectrum of Xe2 excimers produced by bombarding pure Xe gas and a Ar-Xe mixture with 70 keV electrons. The spectrum is a continuum centered around 7800 cm-1 of width 900 cm-1. A Franck-Condon analysis of its shape at low pressure (P=0.1 MPa) has allowed to infer that the emission is due to a bound-free transition between 0u + and 0g + molecular states correlated with 6p and 6s atomic limit, respectively. The spectrum shows a strong redshift and broadening as pressure is increased up to 3.3 MPa. The shift is explained in terms of dielectric screening and quantum multiple scattering. The different broadening in the pure gas and in the mixture is believed to be a manifestation of the quantum indistinguishability of identical particles.
  • Keywords
    Franck-Condon factors; excimers; luminescence; molecule-electron collisions; red shift; spectral line broadening; xenon; Ar-Xe mixture; Franck-Condon analysis; Xe; Xe2 excimers; bound-free transition; dense gas; dielectric screening; electron impact; electron volt energy 70 keV; infrared emission spectrum; infrared luminescence; molecular states; pressure 3.3 MPa; pure Xe gas; quantum indistinguishability; quantum multiple scattering; redshift; spectrum broadening; Atomic beams; Atomic measurements; Electron emission; Gases; Infrared spectra; Laser excitation; Luminescence; Physics; Production; Stationary state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dielectric Liquids, 2008. ICDL 2008. IEEE International Conference on
  • Conference_Location
    Futuroscope-Chasseneuil
  • Print_ISBN
    978-1-4244-1585-4
  • Electronic_ISBN
    978-1-4244-1586-1
  • Type

    conf

  • DOI
    10.1109/ICDL.2008.4622453
  • Filename
    4622453