Title : 
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores
         
        
            Author : 
Bernardi, P. ; Grosso, M. ; Rebaudengo, M. ; Reorda, M. Sonza
         
        
            Author_Institution : 
Dipt. di Automatica e Informatica, Politecnico di Torino
         
        
        
        
        
        
            Abstract : 
Semiconductor manufacturers aim at delivering new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time-to-market. In this paper we propose an Infrastructure IP (I-IP) intended to be a companion for processor cores. The proposed I-IP is an efficient, low-cost and easy-to-adopt solution for supporting the silicon debug of microprocessor cores and of other cores in a SoC, as it reuses the hardware introduced for implementing processor software-based self test (SBST)
         
        
            Keywords : 
automatic test software; integrated circuit manufacture; microprocessor chips; system-on-chip; infrastructure IP; microprocessor cores; semiconductor manufacture; silicon debug; software-based self test; system-on-chip; Automatic testing; Circuits; Microprocessors; Prototypes; Semiconductor device manufacture; Semiconductor device testing; Silicon; Software testing; System-on-a-chip; Time to market;
         
        
        
        
            Conference_Titel : 
Microprocessor Test and Verification, 2005. MTV '05. Sixth International Workshop on
         
        
            Conference_Location : 
Austin, TX
         
        
        
            Print_ISBN : 
0-7695-2627-6
         
        
        
            DOI : 
10.1109/MTV.2005.11