Title :
What Is Measured in a Picosecond Optoelectronically Gated Scanning Tunneling Microscope ?
Author :
Groeneveld, R.H.M. ; van Kempen, H.
Keywords :
Capacitance; Delay effects; Microscopy; Performance evaluation; Solid modeling; Time measurement; Tunneling;
Conference_Titel :
Quantum Electronics Conference, 1996. EQEC '96., 1996 European
Conference_Location :
Hamburg, Germany
Print_ISBN :
0-7803-3171-0
DOI :
10.1109/EQEC.1996.561871
