DocumentCode
2807374
Title
An improved unbiased method for diffspect quantification in epilepsy
Author
Scheinost, Dustin ; Blumenfeld, Hal ; Papademetris, Xenophon
Author_Institution
Dept. of Diagnostic Radiol., Yale Univ., New Haven, CT, USA
fYear
2009
fDate
June 28 2009-July 1 2009
Firstpage
927
Lastpage
930
Abstract
Determining the region of seizure onset is of critical importance for treating medically intractable epilepsy. Comparisons between an ictal and interictal Single Photon Emission Computed Tomography (SPECT) images have been shown to be successful in localizing focal epilepsy. The Ictal-Interictal Subtraction Analysis by Statistical Parametric Mapping (ISAS) algorithm remains one the more successful algorithms for comparing these images. However ISAS is limited by its statistical design. This design introduces a scan order bias in the estimation of the normal variance of sequential SPECT images. We have corrected this bias by estimating the normal variance with a half-normal distribution. In this paper we present an updated algorithm (ISAS HN) based on the original ISAS algorithm with a corrected estimate of the normal variance and an open-source utility for ISAS HN.
Keywords
brain; medical disorders; medical image processing; single photon emission computed tomography; statistical analysis; ISAS HN; ISAS algorithm; focal epilepsy localisation; half normal distribution; ictal-interictal subtraction analysis; interictal SPECT; medically intractable epilepsy; scan order bias; seizure onset region determinaion; sequential SPECT image variance; single photon emission computed tomography; statistical parametric mapping; unbiased diffspect quantification method; Algorithm design and analysis; Biomedical imaging; Electrodes; Electroencephalography; Epilepsy; Instruction sets; Mathematical model; Medical diagnostic imaging; Single photon emission computed tomography; Surgery; Change detection; Epilepsy; SPECT;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1945-7928
Print_ISBN
978-1-4244-3931-7
Electronic_ISBN
1945-7928
Type
conf
DOI
10.1109/ISBI.2009.5193205
Filename
5193205
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