Title :
An AI based approach to automatic fault diagnosis for mixed digital/analogue circuits
Author :
Arslan, T.S. ; Bottaci, L. ; Taylor, G.E.
Author_Institution :
Dept. of Electron. Eng., Hull Univ., UK
Abstract :
Two techniques are applied to a fault diagnosis problem. The data consists of functional test reports for faulty PCBs. The first technique uses an automatically generated decision tree. The second technique seeks to mimic the problem solving behaviour of the expert fault finder and uses a knowledge-base of test reports and associated matching rules. The two techniques are described and compared with respect to performance and implementation difficulty
Keywords :
application specific integrated circuits; artificial intelligence; automatic testing; fault location; integrated circuit testing; knowledge engineering; trees (mathematics); automatic fault diagnosis; automatically generated decision tree; expert fault finder; faulty PCBs; functional test reports; implementation; knowledge-base; matching rules; mixed digital/analogue circuits; performance; problem solving behaviour;
Conference_Titel :
Design and Test of Mixed Analogue and Digital Circuits, IEE Colloquium on
Conference_Location :
London