Title :
Reliability of high Tg copper clad laminate for lead-free assembly
Author :
Liu, Ado ; Chen, Jeng-i
Author_Institution :
ITEQ Corp., Taoyuan
Abstract :
A general property review of high Tg copper clad laminate materials is reported. The characteristics of both dicy-cured and PN-cured materials are discussed. The properties of PN-cured materials are compared with those of conventional dicy-cured high Tg materials. These PN-cured materials have shown enhanced thermal resistance. In addition, a low thermal expansion high Tg material is also presented. The advantages of lowering thermal expansion of a material are reported based on several experimental results. The properties of laminates studied include Tg, thermal decomposition temperature, thermal expansion, and time-to-delamination, drilling processability, and interconnect stress test. The results of the tested materials are presented and the recommendation for material selection is also discussed.
Keywords :
assembling; copper; curing; delamination; laminates; pyrolysis; reliability; thermal expansion; thermal resistance; PN-cured materials; dicy-cured materials; drilling processability; high Tg copper clad laminate materials; interconnect stress test; lead-free assembly; thermal decomposition temperature; thermal expansion; thermal resistance; time-to-delamination; Assembly; Copper; Drilling; Environmentally friendly manufacturing techniques; Laminates; Temperature; Thermal decomposition; Thermal expansion; Thermal resistance; Thermal stresses;
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology, 2007. IMPACT 2007. International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-1636-3
Electronic_ISBN :
978-1-4244-1637-0
DOI :
10.1109/IMPACT.2007.4433618