Title :
Degradation of organic molecules by streamer and spark discharges in water: A measurement of the energetic efficiency
Author :
Dang, T.H. ; Denat, A. ; Lesaint, O.
Author_Institution :
Grenoble Electr. Eng. Lab. (G2E Lab.), INPG & Joseph Fourier Univ., Grenoble
fDate :
June 30 2008-July 3 2008
Abstract :
This paper presents an experimental study of pre-breakdown discharges in water (usually called ldquostreamersrdquo) and transient breakdown arcs (called ldquosparksrdquo) generated by high voltage pulses, in relation with their potential application to degrade organic molecules for depollution purposes. An experimental set-up is described using semiconductor high voltage switches to produce high voltage pulses. In a point-plane gap, depending on the high voltage pulse duration, either streamers alone or streamers followed by a transient breakdown arc can be produced. Electrical measurements provide data correlated to streamer and spark processes: current, charge, power, and dissipated energy. Coupled to these electrical measurements, the degradation of 4-chlorophenol and 4-nitrophenol molecules is studied by HPLC measurements. It is reported that the energy yield for the degradation of these products is higher when sparks are used instead of streamers.
Keywords :
organic compounds; semiconductor switches; sparks; water; 4-chlorophenol molecules; 4-nitrophenol molecules; HPLC measurements; depollution purposes; electrical measurements; energetic efficiency; high voltage pulses; organic molecules; point-plane gap; pre-breakdown discharges; semiconductor switches; spark discharges; streamer discharges; transient breakdown arcs; water; Breakdown voltage; Charge measurement; Current measurement; Electric variables measurement; Energy measurement; Power measurement; Power semiconductor switches; Pulse generation; Sparks; Thermal degradation;
Conference_Titel :
Dielectric Liquids, 2008. ICDL 2008. IEEE International Conference on
Conference_Location :
Futuroscope-Chasseneuil
Print_ISBN :
978-1-4244-1585-4
Electronic_ISBN :
978-1-4244-1586-1
DOI :
10.1109/ICDL.2008.4622527