Title :
Steerable filters for orientation estimation and localization of fluorescent dipoles
Author :
Aguet, François ; Geissbühler, Stefan ; Märki, Iwan ; Lasser, Theo ; Unser, Michael
Author_Institution :
Biomed. Imaging Group, Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
fDate :
June 28 2009-July 1 2009
Abstract :
Fluorescence localization microscopy (i.e., PALM, STORM) has enabled optical imaging at nanometer-scale resolutions. The localization algorithms used in these techniques rely on fitting a 2-D Gaussian to the in-focus image of individual fluorophores. For fixed fluorophores, however, the observed diffraction pattern depends on the orientation of the underlying molecular dipole and does not necessarily correspond to a section of the system´s point spread function. By using a physically realistic image formation model for dipoles to perform the fit, both the position and orientation of the dipole can be estimated with high accuracy, improving upon Gaussian localization. In this paper, we present an algorithm for joint position and orientation estimation based on a 3-D steerable filter, and show that the results are near-optimal with respect to the Cramer-Rao bounds. We show that patterns generated using estimated positions and orientations closely fit experimental measurements.
Keywords :
biomedical optical imaging; feature extraction; fluorescence; image resolution; medical image processing; optical microscopy; optical transfer function; Cramer-Rao bounds; diffraction pattern; fluorescence localization microscopy; fluorescent dipoles; image formation model; molecular dipole; nanometer-scale resolution; orientation estimation; point spread function; steerable filter; Biomedical optical imaging; Fluorescence; Focusing; Image resolution; Optical diffraction; Optical filters; Optical imaging; Optical microscopy; Stimulated emission; Storms; Fluorescence microscopy; Fluorescent dipoles; Localization; Steerable filters; Superresolution;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-3931-7
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2009.5193265