Title :
Electric characterization of films peeled from the insulation of extruded HVDC cables
Author :
Zebouchi, N. ; Carstensen, P. ; Farkas, A.A. ; Campus, A. ; Nilsson, U.H.
Author_Institution :
Corporate Res., ABB AB, Vasteras, Sweden
Abstract :
During the manufacture of cross-linked polyethylene cables the insulation material experiences temperature protocols which vary with the radial position. The time-temperature scheme has, however, a major influence on microstructure of the insulation and chemical composition of the peroxide by-products. Thus it could be expected that the electrical properties of the insulation would vary with the spatial position within the cable. The purpose of the present work is to identify if there is a difference in the DC-electric properties at different radial depths of an extruded high voltage direct current (HVDC) cable insulation. In this study, DC electrical resistivity and DC breakdown strength measurements were carried out on samples taken from the insulation regions close to the inner and outer the semi-conductive screens. The obtained results show no significant difference of the investigated electric properties between the two regions. Hence, the DC-electric properties of the bulk insulation are constant within the accuracy of measurements.
Keywords :
XLPE insulation; chemical analysis; electric breakdown; electric strength; electric variables measurement; electrical resistivity; power cable insulation; DC breakdown strength measurement; DC electrical resistivity measurement; DC-electric property; chemical composition; cross-linked polyethylene cable; electric characterization; extruded HVDC cable insulation film; insulation microstructure; peroxide by-product; radial position; semiconductive screen; spatial position; temperature protocol; time-temperature scheme; Cable insulation; Cables; Chemicals; Dielectrics and electrical insulation; HVDC transmission; Manufacturing; Microstructure; Polyethylene; Protocols; Temperature;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on
Print_ISBN :
0-7803-9257-4
DOI :
10.1109/CEIDP.2005.1560625