Title :
Model fitting of millimetre wave photodiodes to scalar optical and vector return-loss measurements
Author :
Baden Fuller, A.J. ; Humphreys, D.A. ; Runham, M.
Abstract :
The microwave characteristics of a photo detector diode are derived from scalar optoelectronic and microwave vector return-loss measurements. A computer program is used to devise an equivalent circuit to match the measured microwave frequency response. The diode equivalent circuit gives a good match to the measured performance and calculates previously undetermined phase response information.<>
Keywords :
circuit analysis computing; equivalent circuits; loss measurement; microwave measurement; photodetectors; photodiodes; semiconductor device models; computer program; equivalent circuit; microwave characteristics; microwave frequency response; millimetre wave photodiodes; phase response information; photo detector diode; scalar optical measurement; vector return-loss measurements; Circuit simulation; Equivalent circuits; Loss measurement; Microwave measurements; Photodetectors; Photodiodes; Semiconductor device modeling;
Conference_Titel :
What's New in Microwave Measurements (Digest No: 1990/174), IEE Colloquium on
Conference_Location :
London, UK
