DocumentCode :
2809415
Title :
Design of a fault-tolerant microprocessor: a simulation approach
Author :
Lee, Kab Joo ; Choi, Gwan
Author_Institution :
Samsung Electron. Inc., Kyungkido, South Korea
fYear :
1997
fDate :
15-16 Dec 1997
Firstpage :
161
Lastpage :
166
Abstract :
This paper presents an approach for assessing the merits and the cost of incorporating processor-level error detection and recovery mechanisms. The approach is exemplified by implementing several fault-tolerant mechanisms into a 32-bit, MIPS R3000-compatible, RISC microprocessor and conducting simulation-based fault injection experiments. The mechanisms are triple modular redundancy (TMR), retry on duplication-comparison, and retry on parity-checking codes. Reliability gains and performance/area overheads are quantitatively evaluated for each error-detection/recovery scheme. The fault injection analysis results indicate that the highest fault coverage is achieved with the code-based retry technique
Keywords :
fault tolerant computing; microprocessor chips; redundancy; reliability; virtual machines; MIPS R3000-compatible; RISC microprocessor; fault injection analysis; fault-tolerant mechanisms; fault-tolerant microprocessor; performance/area overheads; processor-level error detection; recovery mechanisms; reliability gains; retry on duplication-comparison; retry on parity-checking; simulation; simulation-based fault injection; triple modular redundancy; Analytical models; Circuit faults; Circuit simulation; Fault tolerance; Fault tolerant systems; Hardware; Microprocessors; Performance analysis; Pipelines; Reduced instruction set computing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Systems, 1997. Proceedings., Pacific Rim International Symposium on
Conference_Location :
Taipei
Print_ISBN :
0-8186-8212-4
Type :
conf
DOI :
10.1109/PRFTS.1997.640142
Filename :
640142
Link To Document :
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