• DocumentCode
    2809536
  • Title

    GC-MS and FTIR analysis of LDPE and XLPE deteriorated by partial discharge

  • Author

    Sekii, Yasuo ; Oguma, Hidenori ; Takeo, Hideya ; Yamauchi, Kazuki

  • Author_Institution
    Chiba Inst. of Technol., Narashino, Japan
  • fYear
    2005
  • fDate
    16-19 Oct. 2005
  • Firstpage
    237
  • Lastpage
    240
  • Abstract
    To study the mechanism of deterioration by partial discharge (PD) of low density polyethylene (LDPE) and cross-linked polyethylene (XLPE), experiments were conducted to measure the gas components produced during deterioration by PD. Experiments were performed using an experimental system having voltage application apparatus and equipped with gas measuring system with incorporated gas chromatograph-mass spectrometer (GC-MS). Results of these experiments showed that CO2 is produced when LDPE is subjected to PD in an oxygen-containing atmosphere. The amount of carbon dioxide was found to increase concomitant with the period of voltage application and oxygen content in the area where PD occurs. Taking account of Flourier transform infrared spectrophotometer (FTIR) analysis results for deteriorated LDPE and XLPE in previous experiments, the process of deterioration by PD, together with the antioxidant action on the deterioration, are discussed.
  • Keywords
    Fourier transform spectrometers; XLPE insulation; chromatography; mass spectrometers; partial discharges; CO2; FTIR analysis; Fourier transform IR; LDPE; XLPE; cross-linked polyethylene; gas chromatograph-mass spectrometer; gas measuring system; low density polyethylene; partial discharge; Atmosphere; Atmospheric measurements; Carbon dioxide; Density measurement; Partial discharge measurement; Partial discharges; Performance evaluation; Polyethylene; Spectroscopy; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on
  • Print_ISBN
    0-7803-9257-4
  • Type

    conf

  • DOI
    10.1109/CEIDP.2005.1560665
  • Filename
    1560665