Title :
Pulsed laser validation of recovery mechanisms of critical SEE´s in an artificial neural network system
Author :
Buchner, S. ; Olmos, M. ; Cheynet, Ph. ; Velazco, R. ; McMorrow, D. ; Melinger, J. ; Ecoffet, R. ; Muller, J.D.
Author_Institution :
SFA Inc., Washington, DC, USA
Abstract :
A pulsed laser was used to inject errors into an electronic system consisting of a number of different integrated circuits functioning as a digital version of an artificial neural network. The results confirm that the system as a whole can operate autonomously in the radiation environment of space. Additional work was done to characterize the effects of the upsets on the output of the artificial neural network
Keywords :
laser beam effects; neural chips; radiation hardening (electronics); recovery; space vehicle electronics; artificial neural network; digital integrated circuit; electronic system; error; pulsed laser irradiation; recovery; single event effect; single event upset; space radiation environment; Aerospace engineering; Artificial neural networks; Extraterrestrial measurements; Intelligent networks; Laboratories; Life estimation; Optical pulses; Pulse measurements; Single event upset; System testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location :
Cannes
Print_ISBN :
0-7803-4071-X
DOI :
10.1109/RADECS.1997.698934
