Title :
Applications and onward development of ANSI/IEEE Std 1149.1
Author_Institution :
British Telecom Res. Lab., Ipswich
Abstract :
Many companies, encouraged by the recent introduction of ANSI/IEEE Standard 1149.1 are starting to use boundary-scan techniques for testing loaded PWBs. Applications and future developments of this standard are discussed
Keywords :
automatic testing; logic testing; printed circuit testing; standards; ANSI/IEEE Standard 1149.1; boundary-scan techniques; future developments; loaded PWBs; testing;
Conference_Titel :
Application and Development of the Boundary-Scan Standard, IEE Colloquium on
Conference_Location :
London
