DocumentCode
280992
Title
An initial design study of the use of boundary scan to simplify system test [guided weapons]
Author
Jones, T.D. ; Millward, R.
Author_Institution
Defence Div., Thorn EMI Electron. Ltd., Hayes, UK
fYear
1990
fDate
33226
Firstpage
42461
Lastpage
42465
Abstract
The Defence Division (DD) of Thorn EMI is currently developing a servo-system for a gimballed transceiver as part of a seeker system to be installed in a missile. In order to enhance the test access at the component, board and assembly levels, the use of boundary scan circuits in an ASIC implementation has been addressed. The purpose of this paper is not to review the detailed benefits which have accrued for the particular application, but to illustrate and expand on the system level test strategies which can be adopted
Keywords
aerospace testing; application specific integrated circuits; automatic testing; integrated circuit testing; missiles; servomechanisms; ASIC implementation; Thorn EMI; assembly levels; board; boundary scan; boundary scan circuits; component; gimballed transceiver; missile; seeker system; servo-system; system level test; system test; test access;
fLanguage
English
Publisher
iet
Conference_Titel
Application and Development of the Boundary-Scan Standard, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
191485
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