DocumentCode :
280992
Title :
An initial design study of the use of boundary scan to simplify system test [guided weapons]
Author :
Jones, T.D. ; Millward, R.
Author_Institution :
Defence Div., Thorn EMI Electron. Ltd., Hayes, UK
fYear :
1990
fDate :
33226
Firstpage :
42461
Lastpage :
42465
Abstract :
The Defence Division (DD) of Thorn EMI is currently developing a servo-system for a gimballed transceiver as part of a seeker system to be installed in a missile. In order to enhance the test access at the component, board and assembly levels, the use of boundary scan circuits in an ASIC implementation has been addressed. The purpose of this paper is not to review the detailed benefits which have accrued for the particular application, but to illustrate and expand on the system level test strategies which can be adopted
Keywords :
aerospace testing; application specific integrated circuits; automatic testing; integrated circuit testing; missiles; servomechanisms; ASIC implementation; Thorn EMI; assembly levels; board; boundary scan; boundary scan circuits; component; gimballed transceiver; missile; seeker system; servo-system; system level test; system test; test access;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Application and Development of the Boundary-Scan Standard, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
191485
Link To Document :
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