Lateral shift of a Gaussian beam reflected at a dielectric-chiral interface

The reflection of a Gaussian beam at a dielectric-chiral interface is examined theoretically, and numerical results are presented. It is shown that for a dielectric-chiral interface a critical angle occurs when each of the two normal modes in the chiral media becomes evanescent. In addition, when the incident wave is polarized perpendicular to the plane of incidence both polarizations (parallel and perpendicular) are reflected. Therefore, for either polarization of the incident beam, two beams are expected to be reflected. Phenomena similar to the Goos-Hanchen shift are found to exist for both reflected beams for angles of incidence between the two critical angles.<>