DocumentCode :
2810773
Title :
A new diagnosis of the XLPE insulation with water treeing by space charge measurements with the thermal step method and water nuclear magnetic resonance imaging
Author :
Castellon, J. ; Agnell, S. ; Toureille, A. ; Platbrood, G. ; Tits, Y. ; Adriaensens, P. ; Carleer, R. ; Vangulick, D.
Author_Institution :
Lab. d´´Electrotech. de Montpellier, France
fYear :
2005
fDate :
16-19 Oct. 2005
Firstpage :
536
Lastpage :
539
Abstract :
In this paper the XLPE insulation degraded by water trees by water inception through external cracks in the PVC sheath has been studied by different techniques. Classical techniques has been used as the optical microscope examination of water trees after coloration, FT-IR mapping of cut thin films but also with other methods of investigation as space charges measurement by the thermal step method and magnetic resonance imaging (MRI) for water penetration. Three regions with water absorbance have been detected. The TSM technique is also a nondestructive tool to diagnose the presence of water treeing in cables insulation. The interpretation of the TSM results is in accordance with the observed morphology identified by optical microscopy and MRI.
Keywords :
NMR imaging; XLPE insulation; cable insulation; cable sheathing; cable testing; charge measurement; insulation testing; nondestructive testing; optical microscopes; polymers; space charge; trees (electrical); FT-IR mapping; MRI; PVC sheath; TSM; XLPE insulation; cable insulation; magnetic resonance imaging; nondestructive tool; nuclear magnetic resonance imaging; optical microscope; space charge measurement; thermal step method; thin films; water absorbance; water degradation; water inception; water penetration; water treeing; Charge measurement; Current measurement; Magnetic force microscopy; Magnetic resonance imaging; Nuclear measurements; Optical films; Optical microscopy; Space charge; Thermal degradation; Trees - insulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on
Print_ISBN :
0-7803-9257-4
Type :
conf
DOI :
10.1109/CEIDP.2005.1560738
Filename :
1560738
Link To Document :
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