DocumentCode
2811005
Title
Probabilistic Pattern Matching in KIMS Inspection Expert System
Author
Ntuen, Celestine A. ; Park, Eui H. ; Kim, Jung H.
Author_Institution
Department of Electrical Engineering NC A&T State University, NC
fYear
1992
fDate
1-3 Mar 1992
Firstpage
473
Lastpage
476
Keywords
Character recognition; Diagnostic expert systems; Expert systems; Feature extraction; Histograms; Image segmentation; Inspection; Layout; Medical expert systems; Pattern matching;
fLanguage
English
Publisher
ieee
Conference_Titel
System Theory, 1992. Proceedings. SSST/CSA 92. The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design
ISSN
0094-2898
Print_ISBN
0-8186-2665-8
Type
conf
DOI
10.1109/SSST.1992.712337
Filename
712337
Link To Document