DocumentCode :
2811067
Title :
Integrated FRACAS systems for F117 infrared acquisition designation system (IRADS) support yield higher MTBMA
Author :
Mukherjee, Arun
Author_Institution :
Raytheon Syst. Co., McKinney, TX, USA
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
26
Lastpage :
29
Keywords :
failure analysis; maintenance engineering; reliability; FRACAS; IRADS; MTBF; MTBMA; failure data; failure reporting and corrective action system; infrared acquisition designation system; maintenance data; mean time between failure; mean time between maintenance action; microsoft access database; reliability; Bonding; Data engineering; Databases; Distributed decision making; Hardware; Maintenance; Reliability engineering; System testing; Systems engineering and theory; Test facilities;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408333
Filename :
1408333
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2811067
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