DocumentCode
2811098
Title
Parametric modeling of concentric fringing electric field sensors
Author
Li, X.B. ; Inclan, V.V. ; Rowe, G.I. ; Mamishev, A.V.
Author_Institution
Sensors, Energy & Autom. Lab., Washington Univ., Seattle, WA, USA
fYear
2005
fDate
16-19 Oct. 2005
Firstpage
617
Lastpage
620
Abstract
Fringing electric field (FEF) sensors are widely used for non-invasive measurement of material properties, such as porosity, viscosity, temperature, hardness, and degree of cure. FEF sensors have also been used to detect the presence of a material or estimate the concentration of a material within the test environment. There are no generic analytical models for FEF sensors. Their design optimization process often involves complex and time-consuming finite element simulations. This paper presents a tool for improvement of the design process through formulating a universal equation for three-electrode concentric FEF sensors. The equation models the effect of sensor geometry and substrate material on sensor output. The model parameters are determined from a 3-D surface fit of finite element simulation results for the most common type of sensor geometry. The variables in the model are non-dimensionalized, which makes the model applicable to a wider range of sensor designs. Based on the model, the terminal capacitance can be estimated for three-electrode concentric sensors of wide range of sizes.
Keywords
capacitance; electric fields; electric sensing devices; finite element analysis; optimisation; porosity; surface fitting; viscosity; 3-D surface fit; capacitance; degree of cure measurement; design optimization process; finite element simulation; fringing electric field sensor; generic analytical model; hardness measurement; noninvasive measurement; parametric modeling; porosity measurement; sensor geometry; substrate material; temperature measurement; three-electrode concentric sensors; viscosity measurement; Electric variables measurement; Equations; Finite element methods; Geometry; Material properties; Materials testing; Parametric statistics; Solid modeling; Temperature sensors; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on
Print_ISBN
0-7803-9257-4
Type
conf
DOI
10.1109/CEIDP.2005.1560758
Filename
1560758
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