Title :
Early reliability prediction in consumer electronics using Weibull distribution functions
Author :
Ion, Roxana A. ; Sander, Peter C.
Author_Institution :
Eindhoven Univ. of Technol., Netherlands
Keywords :
Weibull distribution; consumer electronics; failure analysis; maximum likelihood estimation; product development; reliability; Weibull distribution function; consumer electronics; failure probability estimation; maximum likelihood estimation; product development; product quality; reliability prediction; warranty period; Consumer electronics; Cost function; Delay estimation; Electronic equipment testing; Feedback; Marketing and sales; Maximum likelihood estimation; Product development; Warranties; Weibull distribution;
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
Print_ISBN :
0-7803-8824-0
DOI :
10.1109/RAMS.2005.1408336