DocumentCode :
2811248
Title :
Event-driven framework for configurable runtime system observability for SOC designs
Author :
Jong Chul Lee ; Kouteib, F. ; Lysecky, Roman
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ, USA
fYear :
2012
fDate :
5-8 Nov. 2012
Firstpage :
1
Lastpage :
10
Abstract :
The deep integration of software and hardware components within complex system-on-chip (SOC) designs prevents the use of traditional analysis and debug methods to observe the internal state of these components. This situation is further exacerbated for in-situ debugging, verification, and certification efforts in which physical access to traditional debug and trace interfaces is unavailable, infeasible, or cost prohibitive. In this paper, we present an overview of an event-driven system-level observation framework that provides low-overhead methods for observing and analyzing designer specified hardware and software events at runtime.
Keywords :
electronic engineering computing; hardware-software codesign; logic design; system-on-chip; SOC design; certification; configurable runtime system observability; debugging; event-driven system-level observation; hardware component; low-overhead method; software component; system-on-chip; verification; Debugging; Hardware; Monitoring; Runtime; Software; System-on-a-chip; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2012 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4673-1594-4
Type :
conf
DOI :
10.1109/TEST.2012.6401554
Filename :
6401554
Link To Document :
بازگشت