DocumentCode :
2811298
Title :
FTA technique addressing parametric failures of complex electronic and hybrid devices
Author :
Verbitsky, David E.
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
103
Lastpage :
108
Keywords :
electronic products; fault trees; risk analysis; FMECA technique; complex electronic devices; failure modes effects and criticality analysis; hybrid devices; parametric failure; reliability; risk analysis; unified rank system; Aerospace control; Cause effect analysis; Consumer electronics; Digital relays; Electronic equipment manufacture; Failure analysis; Intelligent robots; Military communication; Military equipment; US Department of Transportation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408346
Filename :
1408346
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2811298
بازگشت