High resolution X-ray imaging using a silicon strip detector

Author

Beuville, E. ; Cahn, R. ; Cederström, B. ; Danielsson, M. ; Hall, A. ; Hasegawa, B. ; Luo, L. ; Lundqvist, M. ; Nygren, D. ; Oltman, E. ; Vestlund, J. ; Walton, J.

Author_Institution

Lawrence Berkeley Lab., CA, USA

Volume

2

fYear

1997

fDate

9-15 Nov 1997

Firstpage

1269

Abstract

The authors present the first images and an initial evaluation of a scanned-slot X-ray imaging system based on edge-on silicon strip detectors and high-speed low-noise parallel processing ASICs. The authors have demonstrated noiseless single photon counting above a minimal threshold of 7.2 keV. Edge scans show negligible cross talk between different channels in the ASIC. The Modulation Transfer Function (MTF) has been measured and found to agree with the ideal MTF for 100 μm pixel size. The first images are obtained at very low exposures and show the high performance of the system. The authors also present a way of enhancing the X-ray flux to a slot by using a refractive X-ray lens. They believe this focusing device will significantly enhance the potential for scanned-slot X-ray imaging

Keywords

X-ray detection; application specific integrated circuits; biomedical electronics; diagnostic radiography; image resolution; 100 mum; 7.2 keV; Si; X-ray flux; cross talk between different channels; edge scans; focusing device; high resolution X-ray imaging; high-speed low-noise parallel processing ASICs; medical diagnostic imaging; medical instrumentation; modulation transfer function; refractive X-ray lens; silicon strip detector; Application specific integrated circuits; Image edge detection; Image resolution; Parallel processing; Silicon; Strips; Transfer functions; X-ray detection; X-ray detectors; X-ray imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium, 1997. IEEE

Conference_Location

Albuquerque, NM

ISSN

1082-3654

Print_ISBN

0-7803-4258-5

Type

conf

DOI

10.1109/NSSMIC.1997.670541

Filename

670541