Title :
High resolution X-ray imaging using a silicon strip detector
Author :
Beuville, E. ; Cahn, R. ; Cederström, B. ; Danielsson, M. ; Hall, A. ; Hasegawa, B. ; Luo, L. ; Lundqvist, M. ; Nygren, D. ; Oltman, E. ; Vestlund, J. ; Walton, J.
Author_Institution :
Lawrence Berkeley Lab., CA, USA
Abstract :
The authors present the first images and an initial evaluation of a scanned-slot X-ray imaging system based on edge-on silicon strip detectors and high-speed low-noise parallel processing ASICs. The authors have demonstrated noiseless single photon counting above a minimal threshold of 7.2 keV. Edge scans show negligible cross talk between different channels in the ASIC. The Modulation Transfer Function (MTF) has been measured and found to agree with the ideal MTF for 100 μm pixel size. The first images are obtained at very low exposures and show the high performance of the system. The authors also present a way of enhancing the X-ray flux to a slot by using a refractive X-ray lens. They believe this focusing device will significantly enhance the potential for scanned-slot X-ray imaging
Keywords :
X-ray detection; application specific integrated circuits; biomedical electronics; diagnostic radiography; image resolution; 100 mum; 7.2 keV; Si; X-ray flux; cross talk between different channels; edge scans; focusing device; high resolution X-ray imaging; high-speed low-noise parallel processing ASICs; medical diagnostic imaging; medical instrumentation; modulation transfer function; refractive X-ray lens; silicon strip detector; Application specific integrated circuits; Image edge detection; Image resolution; Parallel processing; Silicon; Strips; Transfer functions; X-ray detection; X-ray detectors; X-ray imaging;
Conference_Titel :
Nuclear Science Symposium, 1997. IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7803-4258-5
DOI :
10.1109/NSSMIC.1997.670541
