Title :
Developing high-level reliability languages using a general intermediate domain
Author :
Painter, Robert R. ; Coppit, David
Author_Institution :
Dept. of Comput. Sci., Coll. of William & Mary, Williamsburg, VA, USA
Keywords :
Markov processes; cost reduction; failure analysis; formal specification; high level languages; software reliability; Markov model; cost reduction; failure automaton; formal semantic domain; formal specification; high-level reliability language; intermediate domain language; Automata; Computer science; Costs; Educational institutions; Fault trees; Formal specifications; High level languages; Mathematical model; Reliability engineering; Testing;
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
Print_ISBN :
0-7803-8824-0
DOI :
10.1109/RAMS.2005.1408351