2811653

Analysis of complex repairable systems

Jacob, Daniel ; Amari, Suprasad V.

Relex Software Corp., Greensburg, PA, USA

2005

Jan. 24-27, 2005

183

189

binary decision diagrams; failure analysis; fault tolerant computing; maintenance engineering; BDD; binary decision diagram; combinatorial method; complex repairable system; conditional failure intensity; failure frequency; fault tolerant computing; mean time between failures; network reliability; repair distribution; s-independent component; state-of-art data structures; Analytical models; Availability; Computational modeling; Data structures; Failure analysis; Frequency measurement; Independent component analysis; Reliability engineering; Systems engineering and theory; Time measurement;

English

ieee

Reliability and Maintainability Symposium, 2005. Proceedings. Annual

0149-144X

0-7803-8824-0

conf

10.1109/RAMS.2005.1408359

1408359