• DocumentCode
    2811653
  • Title

    Analysis of complex repairable systems

  • Author

    Jacob, Daniel ; Amari, Suprasad V.

  • Author_Institution
    Relex Software Corp., Greensburg, PA, USA
  • fYear
    2005
  • fDate
    Jan. 24-27, 2005
  • Firstpage
    183
  • Lastpage
    189
  • Keywords
    binary decision diagrams; failure analysis; fault tolerant computing; maintenance engineering; BDD; binary decision diagram; combinatorial method; complex repairable system; conditional failure intensity; failure frequency; fault tolerant computing; mean time between failures; network reliability; repair distribution; s-independent component; state-of-art data structures; Analytical models; Availability; Computational modeling; Data structures; Failure analysis; Frequency measurement; Independent component analysis; Reliability engineering; Systems engineering and theory; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2005. Proceedings. Annual
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-8824-0
  • Type

    conf

  • DOI
    10.1109/RAMS.2005.1408359
  • Filename
    1408359