DocumentCode :
2811740
Title :
Reliability prediction through degradation data modeling using a quasi-likelihood approach
Author :
Jayaram, J.S.R. ; Girish, T.
Author_Institution :
Design Technol. Inst., Singapore
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
193
Lastpage :
199
Keywords :
Monte Carlo methods; Poisson distribution; maximum likelihood estimation; process design; product design; product development; time to market; Poisson; confidence band; degradation data modeling; generalized estimating equation; marginal distribution; multivariate Monte Carlo simulation; process design; product design; product development; quasi-likelihood approach; quasilikelihood approach; reliability prediction; time to market; Consumer products; Degradation; Life estimation; Life testing; Performance evaluation; Poisson equations; Predictive models; Process design; Product development; Statistical distributions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408361
Filename :
1408361
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2811740
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