DocumentCode :
2811978
Title :
An interval estimate of mean-time-to-failure for a product with reciprocal weibull degradation failure rate
Author :
Polavarapu, Indira ; Okogbaa, Geoffrey
Author_Institution :
Univ. of South Florida, Tampa, FL, USA
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
261
Lastpage :
265
Keywords :
Weibull distribution; customer satisfaction; failure analysis; life testing; light emitting diodes; minimisation; planning; product customisation; MTTF; accelerated degradation tests; assessing product reliability; customer satisfaction; degradation test planning; mean time to failure; minimization; product failure; reciprocal Weibull distribution; Data mining; Degradation; Frequency; Inspection; Life estimation; Life testing; Manufacturing; Robustness; Stress; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408372
Filename :
1408372
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2811978
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