DocumentCode
2811978
Title
An interval estimate of mean-time-to-failure for a product with reciprocal weibull degradation failure rate
Author
Polavarapu, Indira ; Okogbaa, Geoffrey
Author_Institution
Univ. of South Florida, Tampa, FL, USA
fYear
2005
fDate
Jan. 24-27, 2005
Firstpage
261
Lastpage
265
Keywords
Weibull distribution; customer satisfaction; failure analysis; life testing; light emitting diodes; minimisation; planning; product customisation; MTTF; accelerated degradation tests; assessing product reliability; customer satisfaction; degradation test planning; mean time to failure; minimization; product failure; reciprocal Weibull distribution; Data mining; Degradation; Frequency; Inspection; Life estimation; Life testing; Manufacturing; Robustness; Stress; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN
0149-144X
Print_ISBN
0-7803-8824-0
Type
conf
DOI
10.1109/RAMS.2005.1408372
Filename
1408372
Link To Document