• DocumentCode
    2812180
  • Title

    Static and dynamic performance characterization and comparison of 15 kV SiC MOSFET and 15 kV SiC n-IGBTs

  • Author

    Gangyao Wang ; Huang, Alex Q. ; Fei Wang ; Xiaoqing Song ; Xijun Ni ; Sei-Hyung Ryu ; Grider, David ; Schupbach, Marcelo ; Palmour, John

  • Author_Institution
    NSF FREEDM Syst. Center, North Carolina State Univ., Raleigh, NC, USA
  • fYear
    2015
  • fDate
    10-14 May 2015
  • Firstpage
    229
  • Lastpage
    232
  • Abstract
    This paper presents the static and dynamic performance of 15 kV SiC IGBTs with 2 um and 5 um field-stop buffer layer thicknesses respectively and compares them with 15 kV SiC MOSFET in term of loss and switching capability. Their switching energy for different gate resistors and temperature have been reported and compared. A 5 kHz 10.5 kW 8 kV boost converter has been built and tested using these three devices respectively. The MOSFET based boost converter has the highest efficiency 99.39% which is the highest reported efficiency for a high voltage SiC device based converter. PLECS loss models can be developed for these devices based on the characterization data to simplify the simulation of a variety circuits or applications which potentially utilize these devices.
  • Keywords
    MOSFET circuits; buffer layers; insulated gate bipolar transistors; power convertors; power transistors; semiconductor device models; silicon compounds; wide band gap semiconductors; MOSFET based boost converter; PLECS loss models; SiC; field-stop buffer layer thicknesses; frequency 5 kHz; gate resistors; n-IGBT; power 10.5 kW; size 2 mum; size 5 mum; switching capability; switching energy; voltage 15 kV; voltage 8 kV; Decision support systems; Insulated gate bipolar transistors; Integrated circuits; MOSFET; Power semiconductor devices; Silicon carbide; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on
  • Conference_Location
    Hong Kong
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-6259-4
  • Type

    conf

  • DOI
    10.1109/ISPSD.2015.7123431
  • Filename
    7123431