A resistive edge treated Gregorian subreflector for a dual chamber compact range measurement system

The performance of a dual-chamber compact range measurement system with a resistive edge treated Gregorian subreflector was studied. It was shown that the resistive edge treated Gregorian subreflector can provide a good-quality target zone. For the best performance, the resistive cards should be as large as possible and should have zero resistance near the basic subreflector edges. For nonzero resistance near the edges, the basic subreflector should be made a little larger. Thus, one may wish to use a somewhat smaller resistive card.<>