Title :
The study on the test generation of digital circuit on the basis of the GA and the ant colony algorithm
Author :
Zhou, Xun ; Wang, Xiaoli
Author_Institution :
Acad. of Armored Forces Engineerng, Beijing, China
Abstract :
A kind of algorithm about the test generation of digital circuit is provided. This method is on the basis of the GA and the ant colony algorithm. Through the rotation call of the two kinds of algorithm, the test generation vector is optimized. From experimental results, this algorithm is feasible.
Keywords :
circuit testing; optimisation; ant colony algorithm; digital circuit test generation; rotation call; test generation vector; Algorithm design and analysis; Computers; Digital circuits; Fires; Test pattern generators; Very large scale integration; Ant colony algorithm; Digital circuit; GA; Test generation;
Conference_Titel :
Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on
Conference_Location :
Hohhot
Print_ISBN :
978-1-4244-9436-1
DOI :
10.1109/MACE.2011.5988040
