• DocumentCode
    2812303
  • Title

    The ENEA activity on compact far infrared FELs

  • Author

    Doria, A. ; Gallerano, G.P. ; Giovenale, E. ; Messina, G. ; Petralia, A. ; Spassovsky, I.

  • Author_Institution
    Dept. of Phys. Technol. & New Mater., ENEA, Frascati, Italy
  • fYear
    2009
  • fDate
    28-30 April 2009
  • Firstpage
    544
  • Lastpage
    545
  • Abstract
    The Free Electron Laser (FEL) is a very interesting device with many peculiar characteristics that makes it unique [1]. It is essentially based on the interaction between a free electron and a photon. It is well known that a single electron cannot emit or absorb a single photon in vacuum, due to the fact that energy and momentum conservation laws cannot be violated. But if we move our problem from vacuum to a medium having a refractive index n, the photon dispersion relation changes, allowing an emission process called Cerenkov effect. This is not the only emission mechanism permitted, the most exploited one is related to the Compton Scattering. This process can be fully understood in a quantum picture, within which a simultaneous process of emission and absorption of photons can be explained by means of a virtual state; an intense magnetic field, in a relativistic regime, can be regarded as a virtual photon and, from the energy-moment conservation laws, the absorbed and emitted photon are simply connected by the electron kinetic energy.
  • Keywords
    conservation laws; energy conservation; free electron lasers; Cerenkov effect; Compton scattering; ENEA activity; compact far infrared FEL; electron kinetic energy; emission process; energy conservation laws; energy-moment conservation law; free electron laser; intense magnetic field; momentum conservation laws; peculiar characteristics; photon dispersion relation; quantum picture; single electron; single photon; virtual photon; Absorption; Dispersion; Electromagnetic scattering; Electron emission; Elementary particle vacuum; Free electron lasers; Kinetic energy; Magnetic fields; Particle scattering; Refractive index; Free Electron Laser Sources; THz FELs; energy-phase correlation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2009. IVEC '09. IEEE International
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-3500-5
  • Electronic_ISBN
    978-1-4244-3501-2
  • Type

    conf

  • DOI
    10.1109/IVELEC.2009.5193455
  • Filename
    5193455