DocumentCode
2812315
Title
Commissioning and testing of a commercial intensity modulated treatment planning system
Author
Kuchnir, Franca T. ; Reft, C.S. ; Johnson, L. Scott ; Kung, Jong H. ; Pelizzari, Charles A. ; Roeske, John C.
Author_Institution
Dept. of Radiat. & Cellular Oncology, Chicago Univ., IL, USA
Volume
2
fYear
2000
fDate
2000
Firstpage
1184
Abstract
We report on the commissioning and testing of a commercial intensity-modulated radiation treatment planning system, Corvus 3.0. It is based on a simulated annealing inverse planning algorithm that generates intensity-modulated fluence maps and monitor units for each treatment field. Treatments were delivered with a dynamic multi-leaf collimator using the “step-and-shoot” method. Fidelity of delivery of the modulated beams was verified with film dosimetry. Dose to isocenter and isodose distributions in various axial planes were measured with ion chamber, film and TLDs. A simple algorithm was developed to independently calculate the dose at isocenter using the fluence maps and monitor units generated by Corvus. All tests demonstrated agreement with the Corvus calculations to ±3%. Detailed results are presented and discussed
Keywords
commissioning; dosimetry; intensity modulation; medical computing; radiation therapy; simulated annealing; Corvus 3.0; axial planes; commercial system; commissioning; dose to isocenter distributions; dynamic multileaf collimator; dynamic treatment delivery; fidelity of delivery; film dosimetry; intensity modulated treatment planning system; intensity-modulated fluence maps; isodose distributions; modified Clarkson integration; monitor units; radiation treatment planning; simulated annealing inverse planning algorithm; step-and-shoot method; testing; Biomedical optical imaging; Computed tomography; Imaging phantoms; Intensity modulation; Inverse problems; Optical films; Optical modulation; Patient monitoring; Scattering; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location
Chicago, IL
ISSN
1094-687X
Print_ISBN
0-7803-6465-1
Type
conf
DOI
10.1109/IEMBS.2000.897939
Filename
897939
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