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Reliability prediction using multivariate degradation data

Xu, D. ; Zhao, Wenbiao

American Express, Phoenix, AZ, USA

2005

Jan. 24-27, 2005

337

341

failure analysis; regression analysis; reliability; state-space methods; stochastic processes; stress effects; correlation; degradation dynamics; likelihood approximation; logistic function; logistic regression; multivariate degradation data; probabilistic measure; random stress effect; reliability prediction; state-space model; stochastic stress condition; Acceleration; Data analysis; Degradation; Failure analysis; Logistics; Materials science and technology; Predictive models; Stochastic processes; Stress measurement; Testing;

English

ieee

Reliability and Maintainability Symposium, 2005. Proceedings. Annual

0149-144X

0-7803-8824-0

conf

10.1109/RAMS.2005.1408385

1408385