DocumentCode :
2812424
Title :
A scheme to obtain propagation characteristics of multilayer structures using spectral methods
Author :
Basterrechea, J. ; Gago, E. ; Catedra, M.F.
Author_Institution :
Dept de Electronica, Univ. Cantabria, Santander, Spain
fYear :
1991
fDate :
24-28 June 1991
Firstpage :
1244
Abstract :
An application of the conjugate gradient method in combination with the fast Fourier transform (CG-FFT) for the analysis of multilayer structures is presented. The first step in the process is solving the electric field integral equation (EFIE), which is done using a sampling procedure with rooftop functions to represent the induced current and pulses to average the fields. The second step is the computation of the field components at different levels of the structure. Finally, these data can be used to compute the desired parameters for microstrip circuit design purposes. Results obtained with the proposed scheme are presented.<>
Keywords :
conjugate gradient methods; fast Fourier transforms; integral equations; strip lines; transmission line theory; CG-FFT method; EFIE; conjugate gradient-fast Fourier transform method; electric field integral equation; microstrip circuit design; multilayer structures; open-ended microstrip structure; propagation characteristics; rooftop functions; sampling procedure; spectral methods; Fourier transforms; Gradient methods; Green´s function methods; Impedance; Metallization; Microstrip; Nonhomogeneous media; Sampling methods; Telecommunications; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1991. AP-S. Digest
Conference_Location :
London, Ontario, Canada
Print_ISBN :
0-7803-0144-7
Type :
conf
DOI :
10.1109/APS.1991.175073
Filename :
175073
Link To Document :
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