RF power absorption and electric and magnetic field enhancements due to surface roughness

Author

Zhang, Peng ; Lau, Y.Y. ; Gilgenbach, R.M.

Author_Institution

Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA

fYear

2009

fDate

28-30 April 2009

Firstpage

556

Lastpage

557

Abstract

In this work, we analytically compute the power absorption due to a hemispherical protrusion on a resonant cavity´s surface. The permittivity, conductivity, and permeability of the protrusion may assume arbitrary values. The local field enhancement factors of both electric field and magnetic field on the protrusion are also calculated analytically. These calculations have been spot-checked against the Maxwell-3D code.

Keywords

cavity resonators; electric fields; electrical conductivity; electromagnetic wave absorption; magnetic fields; magnetic permeability; permittivity; surface roughness; Maxwell-3D code; RF power absorption; conductivity; electric field enhancement; hemispherical protrusion; local field enhancement; magnetic field enhancement; permeability; permittivity; resonant cavity surface; surface roughness; Absorption; Conductivity; Magnetic analysis; Magnetic fields; Magnetic resonance; Permeability; Permittivity; Radio frequency; Rough surfaces; Surface roughness; RF power absorption; electric field enhancement; magnetic field enhancement; surface roughness;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference, 2009. IVEC '09. IEEE International

Conference_Location

Rome

Print_ISBN

978-1-4244-3500-5

Electronic_ISBN

978-1-4244-3501-2

Type

conf

DOI

10.1109/IVELEC.2009.5193466

Filename

5193466