DocumentCode :
2812522
Title :
Managing quality & reliability with less information
Author :
Ganesh, Nagappan ; Lu, Yuan ; Ouden, Elke Den ; Brombacher, Aarnout C.
Author_Institution :
Philips Optical Storage Singapore, Singapore
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
379
Lastpage :
385
Keywords :
consumer electronics; innovation management; product development; quality function deployment; reliability; risk analysis; socio-economic effects; QFD; RQM; industrial process; innovative PDP; process reliability; product development processes; product technology; quality function deployment; quality management; reliability and quality matrix; risk factors; socio-economic factors; uncertainty coverage; Consumer electronics; Diffusion tensor imaging; Electronics industry; Information management; Manufacturing industries; Product development; Quality function deployment; Quality management; Technological innovation; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408392
Filename :
1408392
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2812522
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