DocumentCode :
2812548
Title :
Competing failure mode modeling in a bayesian reliability assessment tool
Author :
Groen, Frank ; Droguett, Enrique López
Author_Institution :
Prediction Technol. Inc., USA
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
393
Lastpage :
397
Keywords :
Bayes methods; Weibull distribution; failure analysis; product design; reliability; Bayesian reliability assessment tool; Weibull; competing failure mode modeling; failure distributions; products design; single analysis; system-level reliability assessments; Aging; Automotive engineering; Bayesian methods; Data engineering; Design engineering; Failure analysis; Performance analysis; Product design; Reliability engineering; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408394
Filename :
1408394
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2812548
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