DocumentCode
2812548
Title
Competing failure mode modeling in a bayesian reliability assessment tool
Author
Groen, Frank ; Droguett, Enrique López
Author_Institution
Prediction Technol. Inc., USA
fYear
2005
fDate
Jan. 24-27, 2005
Firstpage
393
Lastpage
397
Keywords
Bayes methods; Weibull distribution; failure analysis; product design; reliability; Bayesian reliability assessment tool; Weibull; competing failure mode modeling; failure distributions; products design; single analysis; system-level reliability assessments; Aging; Automotive engineering; Bayesian methods; Data engineering; Design engineering; Failure analysis; Performance analysis; Product design; Reliability engineering; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN
0149-144X
Print_ISBN
0-7803-8824-0
Type
conf
DOI
10.1109/RAMS.2005.1408394
Filename
1408394
Link To Document