• DocumentCode
    2812770
  • Title

    A GaN HEMT driver IC with programmable slew rate and monolithic negative gate-drive supply and digital current-mode control

  • Author

    Rose, M. ; Wen, Y. ; Fernandes, R. ; Van Otten, R. ; Bergveld, H.J. ; Trescases, O.

  • Author_Institution
    NXP Semicond., Eindhoven, Netherlands
  • fYear
    2015
  • fDate
    10-14 May 2015
  • Firstpage
    361
  • Lastpage
    364
  • Abstract
    This work presents an intelligent driver IC for 400 V GaN-based Power Factor Correction (PFC) applications. The targeted power level of the converter is 100 W, with a switching frequency above 500 kHz. The IC was implemented in a 140 nm automotive BCD SOI process, while the GaN HEMT and Schottky diode were optimized in a Si-fab compatible GaN-on-Si process. A low-Ron DMOS is integrated in the driver IC to achieve high-speed cascode switching operation. The chip also features a novel dual-mode drive scheme with monolithic negative drive voltage capability and programmable slew rate, as well as a digital peak current-mode controller. Advanced digital PFC control schemes can therefore be implemented, while EMC performance and efficiency can be optimized through active slope control.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MOS integrated circuits; Schottky diodes; digital control; driver circuits; electric current control; elemental semiconductors; gallium compounds; power convertors; power factor correction; silicon; silicon-on-insulator; wide band gap semiconductors; EMC performance; GaN; HEMT driver IC; Schottky diode; Si; active slope control; advanced digital PFC control schemes; automotive BCD SOI process; converter; digital peak current-mode controller; dual-mode drive scheme; high-speed cascode switching operation; intelligent driver IC; low-Ron DMOS; monolithic negative gate-drive supply; power 100 W; power factor correction; programmable slew rate; size 140 nm; voltage 400 V; Gallium nitride; HEMTs; High definition video; Integrated circuits; Logic gates; Manganese; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on
  • Conference_Location
    Hong Kong
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-6259-4
  • Type

    conf

  • DOI
    10.1109/ISPSD.2015.7123464
  • Filename
    7123464