Title :
A new bayesian network approach to solve dynamic fault trees
Author :
Boudali, Hichem ; Duga, J.B.
Author_Institution :
Virginia Univ., Charlottesville, VA, USA
Keywords :
Markov processes; belief networks; binary decision diagrams; fault trees; Bayesian network approach; Markov chain generation; combinatorial models; components behaviors; dynamic fault tree model; dynamic system components; reliability modeling; state space explosion problem; Bayesian methods; Binary decision diagrams; Boolean functions; Data structures; Explosions; Fault trees; Power system modeling; Power system reliability; Random variables; State-space methods;
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
Print_ISBN :
0-7803-8824-0
DOI :
10.1109/RAMS.2005.1408404