Title : 
Multiple failure mode and effects analysis - an approach to risk assessment of multiple failures with FMEA
         
        
            Author : 
Pickard, Karsten ; Müller, Peter ; Bertsche, Bernd
         
        
            Author_Institution : 
Inst. of Mach. Components, Stuttgart Univ., Germany
         
        
        
        
        
        
            Keywords : 
Boolean algebra; fault trees; mechatronics; product design; risk analysis; Boolean logic; FMEA; FTA; failure mode and effects analysis; failure networks quantitative information; fault tree analysis; mFMEA; mechatronical systems; multiple failure mode and effects analysis; product design; reliability analysis; risk assessment; systems availability; Control systems; Failure analysis; Fault trees; Machine components; Performance analysis; Product design; Quality function deployment; Risk analysis; Risk management; US Department of Transportation;
         
        
        
        
            Conference_Titel : 
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
         
        
        
            Print_ISBN : 
0-7803-8824-0
         
        
        
            DOI : 
10.1109/RAMS.2005.1408405