Title :
Helix TWT yield improvement by helix pitch optimization
Author :
Mineo, Mauro ; Paoloni, Claudio
Author_Institution :
Dept. of Electron. Engneering, Univ. of Roma Tor Vergata, Rome, Italy
Abstract :
The knowledge and the control of fabrication tolerance are key issues to get the required traveling wave tube performance. The comprehension of the factors that mainly determine a yield degradation is required to avoid higher costs in the manufacturing process. This paper proposes a method to improve the yield of multi-section helix traveling wave tubes before the fabrication. Small-signal gain performance goal is assumed as the design target.
Keywords :
microwave tubes; travelling wave tubes; helix TWT yield improvement; helix pitch optimization; small-signal gain performance; traveling wave tube; yield degradation; Costs; Degradation; Fabrication; Manufacturing processes; Performance gain; Slow wave structure (SWS); Tolerance; Traveling wave tube (TWT); Yield;
Conference_Titel :
Vacuum Electronics Conference, 2009. IVEC '09. IEEE International
Conference_Location :
Rome
Print_ISBN :
978-1-4244-3500-5
Electronic_ISBN :
978-1-4244-3501-2
DOI :
10.1109/IVELEC.2009.5193485