Title :
A soft error mitigation scheme for safety-critical computer systems
Author :
Yu, Yangyang ; Johnson, Barry W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Univ., Charlottesville, VA, USA
Keywords :
Hamming codes; error handling; parity check codes; redundancy; safety; software reliability; Hamming code; error correction code; error detection code; information redundancy; memory reliability; memory safety; memory-data stream; parity check code; safety-critical computer system; soft error mitigation; Alpha particles; CMOS integrated circuits; Computer errors; Error correction; Field programmable gate arrays; Integrated circuit technology; Neutrons; Random access memory; Space technology; Very large scale integration;
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
Print_ISBN :
0-7803-8824-0
DOI :
10.1109/RAMS.2005.1408414