Title :
Investigation of X-parameters measurements on a 100 W Doherty power amplifier
Author :
Wood, John ; Collins, Gayle
Author_Institution :
RF Div., Freescale Semicond. Inc., Tempe, AZ, USA
Abstract :
In this article we describe a high-power reflectometer set-up specifically designed for large-signal nVNA measurements for the extraction of X-parameters. The heart of the measurement set-up is an Agilent N5242A PNA-X in nVNA mode. We have measured a Doherty amplifier constructed from a 2-stage, dual-path RF power amplifier IC. This power amplifier can deliver in excess of 100 W in Doherty mode, and these measurements represent the highest power X-parameter extraction reported to date.
Keywords :
power amplifiers; radiofrequency amplifiers; Agilent N5242A PNA-X; Doherty power amplifier; RF power amplifier IC; high-power reflectometer; nVNA measurements; x-parameters measurements; Broadband amplifiers; Driver circuits; Heart; High power amplifiers; Microwave circuits; Power amplifiers; Power measurement; Radio frequency; Radiofrequency amplifiers; Signal processing;
Conference_Titel :
Microwave Measurements Conference (ARFTG), 2010 75th ARFTG
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6364-0
DOI :
10.1109/ARFTG.2010.5496319
