• DocumentCode
    2813083
  • Title

    S-functions behavioral model order reduction based on narrowband modulated large-signal network analyzer measurements

  • Author

    Myslinski, Maciej ; Verbeyst, Frans ; Vanden Bossche, Marc ; Schreurs, Dominique

  • Author_Institution
    Div. ESAT-Telemic, K.U.Leuven, Leuven, Belgium
  • fYear
    2010
  • fDate
    28-28 May 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper we report for the first time on order reduction applied to S-functions behavioral models. The most dominant model parameters are selected based on the relative uncertainty of their estimated values evaluated against a threshold value. The selection procedure is performed on the same measurement data that is used to extract the model and obtained using a large-signal network analyzer. High level of model order reduction, achieved without any substantial loss of the prediction accuracy, is demonstrated on S-functions extracted for a packaged pHEMT device.
  • Keywords
    electric variables measurement; high electron mobility transistors; modulation; network analysers; S-functions behavioral model; large-signal network analyzer measurements; model order reduction; narrowband modulation; packaged pHEMT device; relative uncertainty; Accuracy; Data mining; Equations; Frequency domain analysis; Narrowband; PHEMTs; Packaging; Parameter estimation; Predictive models; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurements Conference (ARFTG), 2010 75th ARFTG
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    978-1-4244-6364-0
  • Type

    conf

  • DOI
    10.1109/ARFTG.2010.5496321
  • Filename
    5496321