DocumentCode :
2813083
Title :
S-functions behavioral model order reduction based on narrowband modulated large-signal network analyzer measurements
Author :
Myslinski, Maciej ; Verbeyst, Frans ; Vanden Bossche, Marc ; Schreurs, Dominique
Author_Institution :
Div. ESAT-Telemic, K.U.Leuven, Leuven, Belgium
fYear :
2010
fDate :
28-28 May 2010
Firstpage :
1
Lastpage :
6
Abstract :
In this paper we report for the first time on order reduction applied to S-functions behavioral models. The most dominant model parameters are selected based on the relative uncertainty of their estimated values evaluated against a threshold value. The selection procedure is performed on the same measurement data that is used to extract the model and obtained using a large-signal network analyzer. High level of model order reduction, achieved without any substantial loss of the prediction accuracy, is demonstrated on S-functions extracted for a packaged pHEMT device.
Keywords :
electric variables measurement; high electron mobility transistors; modulation; network analysers; S-functions behavioral model; large-signal network analyzer measurements; model order reduction; narrowband modulation; packaged pHEMT device; relative uncertainty; Accuracy; Data mining; Equations; Frequency domain analysis; Narrowband; PHEMTs; Packaging; Parameter estimation; Predictive models; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurements Conference (ARFTG), 2010 75th ARFTG
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6364-0
Type :
conf
DOI :
10.1109/ARFTG.2010.5496321
Filename :
5496321
Link To Document :
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